1
Arthur Evans, Joseph R Baker, Robert P Rising: Test probe assembly for testing integrated circuit devices. Wentworth Laboratories, Michael Ebert, December 4, 1990: US04975638 (144 worldwide citation)

A test probe assembly for testing an integrated circuit (IC) device having contact pads deployed in a predetermined pattern in a common plane. The assembly includes a contactor formed by a flexible film of dielectric material having a rectangular planar central zone from whose corners extend radial ...


2
John Brown, Matthew J Costello, Luciano P DosSantos, Robin Ruck: Probe station adapter for backside emission inspection. Wentworth Laboratories, William C Crutcher, September 28, 1999: US05959461 (113 worldwide citation)

An adapter for holding a silicon wafer in an inverted position of a probe station to allow backside emission testing is described. The wafer is positioned in a carrier having an opening therethrough for backside emission testing while the wafer is energized and probed beneath the carrier. A special ...


3
Evans Arthur: Fixed point probe card and an assembly and repair fixture therefor. Wentworth Laboratories, November 19, 1974: US3849728 (113 worldwide citation)

A probe card for testing integrated circuit patterns having contacts deployed thereon, the patterns being formed in a microelectronic substrate. The card includes an opening providing access to a pattern and a ring of spaced conductive pads surrounding the opening. Anchored on selected pads are need ...


4
George H Streib, Randy J Schwindt: Probe station for low current, low voltage parametric measurements using multiple probes. Wentworth Laboratories, William C Crutcher, February 29, 2000: US06031383 (104 worldwide citation)

A probe station has probe manipulators with probe supports disposed around a cover assembly with an inspection opening. Each probe support has a vertical tube extending through an opening in the cover assembly and a horizontal adjustable member extending radially inwardly and supporting a probe hold ...


5
Arthur Evans, Joseph R Baker, Jack Lander: Probe assembly for testing integrated circuit devices. Wentworth Laboratories, Michael Ebert, October 11, 1994: US05355079 (102 worldwide citation)

A probe assembly adapted to test an integrated circuit (IC) device whose contact pads are deployed in a predetermined pattern in a common plane. The assembly includes a film membrane having a planar dielectric contactor zone and an array of suspension wings radiating from this zone. The wings are cl ...


6
Arthur Evans: Assembly fixture for fixed point probe card. Wentworth Laboratories, January 6, 1976: US03930809 (96 worldwide citation)

A fixture for assembling a probe card adapted to test integrated circuit patterns having contacts deployed thereon. The card includes an opening providing access to a pattern and a ring of spaced conductive pads surrounding the opening. Anchored on selected pads are blade-like needle-holders having ...


7
Francis T McQuade, Jack Lander: Probe assembly for testing integrated circuits. Wentworth Laboratories, William C Crutcher, May 16, 1995: US05416429 (77 worldwide citation)

A probe assembly for testing an integrated circuit includes a probe card of insulating material with a central opening, a rectangular frame with a smaller opening attached to the probe card, four separate probe wings each comprising a flexible laminated member having a conductive ground plane sheet, ...


8
Matthew J Costello: Probe holder for low voltage, low current measurements in a water probe station. Wentworth Laboratories, William C Crutcher, September 26, 2000: US06124723 (76 worldwide citation)

A probe holder for a wafer probe station is comprised of a pair of over-and-under rigid extensions, one of which receives the probe shank and the other of which is connected to the probe to make a Kelvin connection. The two coaxial extensions are supported by a vertical tube which contains a pair of ...


9
William F Thiessen: Temperature compensated vertical pin probing device. Wentworth Laboratories, Wiggin and Dana, Anthony P Gangemi, Gregory S Rosenblatt, August 9, 2005: US06927586 (64 worldwide citation)

An improved vertical pin probing device is constructed with a housing with spaced upper and lower spacers of a metal alloy, each having a thin sheet of silicon nitride ceramic material held in a window in the spacer of adhesive. The spacers may be composed of foils adhered to one another in a lamina ...


10
Anthony Paul Martel, Francis T McQuade: Impedance-matched interconnection device for connecting a vertical-pin integrated circuit probing device to integrated circuit test equipment. Wentworth Laboratories, William C Crutcher, December 12, 2000: US06160412 (56 worldwide citation)

An interconnection device used with test probe equipment for connecting a vertical-pin integrated circuit probing device to external test equipment. The interconnection device comprises a probe card with a pattern of contacts, a mounting plate adjustably mounted to the probe card and a space transfo ...