1
Christopher G Talbot, Chiwoei Wayne Lo: Method of detecting defects in patterned substrates. Schlumberger Technologies, Skjerven Morrill MacPherson, June 26, 2001: US06252412 (192 worldwide citation)

Defects in a patterned substrate are detected by positioning a charged-particle-beam optical column relative to a patterned substrate, the charged-particle imaging system having a field of view (FOV) with a substantially uniform resolution over the FOV; operating the charged-particle-beam optical co ...


2
Chiwoei Wayne Lo, Pierre Perez: Microstructure defect detection. Schlumberger Technologies, Skjerven Morrill MacPherson, May 15, 2001: US06232787 (145 worldwide citation)

Methods of inspecting a microstructure comprise: applying charged particles to the wafer to negatively charge up the wafer over a region having contact or via holes, scanning a charged-particle beam over the region while detecting secondary particles so as to produce a detector signal, determining f ...


3
Christopher Graham Talbot, Chiwoei Wayne Lo, Luis Camilo Orjuela, Li Wang: Method and apparatus for detecting defects in wafers. Schlumberger Technologies, Bruce D Riter, Danita J M Maseles, July 18, 2000: US06091249 (126 worldwide citation)

A method for detecting electrical defects in a semiconductor wafer, includes the steps of: a) applying charge to the wafer such that electrically isolated structures are raised to a voltage relative to electrically grounded structures; b) obtaining voltage contrast data for at least a portion of the ...


4
Timothy J Wilkinson, Scott B Guthery, Ksheerabdhi Krishna, Michael A Montgomery: Using a high level programming language with a microcontroller. Schlumberger Technologies, Pehr B Jansson, Danita J M Maseles, October 23, 2001: US06308317 (119 worldwide citation)

An integrated circuit card is used with a terminal. The integrated circuit card includes a memory that stores an interpreter and an application that has a high level programming language format. A processor of the card is configured to use the interpreter to interpret the application for execution a ...


5
William T Lee, Ronny Soetarman, Christopher G Talbot: Method of probing a net of an IC at an optimal probe-point. Schlumberger Technologies, Kenneth Olsen, Martin D Hyden, Bruce D Riter, June 25, 1996: US05530372 (118 worldwide citation)

Probe-point placement methods are described. A layout description, a netlist description and a cross-reference description of an IC are retrieved from storage. The data structures associate with each net name a list of polygons. Polygons of a selected net are broken into segments of a specified step ...


6
William T Lee, Ronny Soetarman, Christopher Graham Talbot: Optimal probe point placement. Schlumberger Technologies, Bruce D Riter, October 7, 1997: US05675499 (111 worldwide citation)

Probe-point placement methods are described. A layout description, a netlist description and a cross-reference description of an IC are retrieved from storage. The data structures associate with each net name a list of polygons. Polygons of a selected net are broken into segments of a specified step ...


7
Scott B Guthery: Validating and certifying execution of a software program with a smart card. Schlumberger Technologies, Pehr B Jansson, Danita J M Maseles, October 23, 2001: US06308270 (110 worldwide citation)

A smart card for use in connection with execution of a software program by a computer includes a microcontroller configured by a program stored in a smart card memory to verify information received from the computer during execution of the software program. The microcontroller is further configured ...


8
Chiwoei Wayne Lo, Kenichi Kanai: Voltage contrast method for semiconductor inspection using low voltage particle beam. Schlumberger Technologies, Norman R Klivans, Skjerven Morrill MacPherson, February 5, 2002: US06344750 (108 worldwide citation)

Defects in a patterned substrate are detected by inspection with a charged particle beam inspection tool which generates an image of a portion of the patterned substrate and compares the image with a reference in order to identify any defects in the patterned substrate. Parameters of the tool are op ...


9
Michael F Deering: Triangle processor for 3-D graphics display system. Schlumberger Technologies, David H Carroll, Robert C Colwell, Paul C Haughey, July 31, 1990: US04945500 (91 worldwide citation)

A process which stores a representation of a polygon forming a portion of a three-dimensional object and compares the polygon to pixels from a scan line as they are passed by. The processor stores a representation of a polygon and compares each pixel passed by the processor to the polygon to determi ...


10
Stuart Robert Pearce: Accurate alignment of clocks in mixed-signal tester. Schlumberger Technologies, Bruce D Riter, August 5, 1997: US05654657 (87 worldwide citation)

Asynchronously-generated digital and analog clocks in a mixed-signal test system are accurately aligned for repeatable and deterministic testing. A variable-frequency digital master clock signal is used in direct digital synthesis of an analog clock signal which is asynchronous to the master clock s ...