1
Stuart M Lindsay, Tianwei Jing: Force sensing probe for scanning probe microscopy. Molecular Imaging Corporation, Arizona Board of Regents, Killworth Gottman Hagan & Schaeff, September 19, 2000: US06121611 (235 worldwide citation)

Force sensing probes for use in scanning probe microscopes and a method for coating such probes with a film comprising a magnetostrictive material are provided. The probes may be magnetized by placing them in a magnetic field which can be oriented in any direction with respect to the probes. The mag ...


2
Stuart M Lindsay: Variable temperature scanning probe microscope based on a peltier device. Molecular Imaging Corporation, D Alessandro & Ritchie, August 5, 1997: US05654546 (44 worldwide citation)

A compact Peltier Device is used to heat or cool a small sample stage of a scanning probe (AFM or STM) microscope. The entire heating/cooling system may fit onto a small platen which may be suspended below the scanning probe where it may be held in place against magnetic balls. Alternatively, the sa ...


3
Stuart M Lindsay: Magnetic modulation of force sensor for AC detection in an atomic force microscope. Molecular Imaging Corporation, D Alessandro & Ritchie, May 7, 1996: US05513518 (41 worldwide citation)

In a scanning force microscope a thin film of a magnetic material is applied to one or both surfaces of a force sensing cantilever. The cantilevers are then placed between the poles of an electromagnet and a magnetizing field applied in the direction of the soft axis of the cantilevers. The field is ...


4
Stuart Lindsay: Controlled force microscope for operation in liquids. Molecular Imaging Corporation, D Alessandro & Ritchie, May 14, 1996: US05515719 (39 worldwide citation)

An atomic force microscope in which the deflection of the force sensing probe owing to surface forces is canceled by an opposing magnetic force applied to a small magnetic particle on a force sensing cantilever. A deflection of the force sensing cantilever is detected by reflecting a laser beam from ...


5
Stuart M Lindsay, Tianwei Jing: Scanning probe microscope for use in fluids. Molecular Imaging Corporation, Killworth Gottman Hagan & Schaeff L, May 12, 1998: US05750989 (36 worldwide citation)

A microscope suitable for use in atomic force microscopy and scanning tunneling microscopy includes an electrochemical liquid cell. Vertically adjustable supporting mounts extend downwardly from a frame and include magnetic balls to which a sample platform may be attached. At least two adjustment pe ...


6
Stuart M Lindsay, Tianwei Jing: Electrochemical identification of molecules in a scanning probe microscope. Molecular Imaging Corporation, D Alessandro & Ritchie, February 27, 1996: US05495109 (35 worldwide citation)

A method and apparatus for high resolution mapping of the chemical composition of a thin film utilizes scanning probe microscopy techniques. The sample to be studied is prepared as a thin film disposed on a conductive backing electrode. A sensitive electrometer is connected to the backing electrode ...


7
Wenhai Han, Stuart M Lindsay, Steven K Harbaugh, Tianwei Jing: Magnetically-oscillated probe microscope for operation in liquids. Molecular Imaging Corporation, Killworth Gottman Hagan & Schaeff L, May 19, 1998: US05753814 (26 worldwide citation)

In accordance with a first aspect of the present invention, the sensitivity of a magnetically modulated AC-AFM is substantially improved by the use of a ferrite-core solenoid for modulating the magnetic cantilever of the ACAFM. In accordance with a second aspect of the present invention, the detecti ...


8
Stuart M Lindsay, Tianwei Jing: Hybrid control system for scanning probe microscopes. Molecular Imaging Corporation, Killworth Gottman Hagan & Schaeff L, September 8, 1998: US05805448 (22 worldwide citation)

A scanning probe microscope controller includes a digital signal processor (DSP) and an analog feedback control loop. The DSP serves to process the output of the scanning probe in the digital realm after conversion of the signal to digital form. After processing, the signal is restored to analog for ...


9
Stuart M Lindsay: Microscope for force and tunneling microscopy in liquids. Molecular Imaging Corporation, D Alessandro & Ritchie, April 15, 1997: US05621210 (20 worldwide citation)

An instrument for carrying out both scanning tunneling microscopy and atomic force microscopy on the same sample under liquid. A microscope body with a magnetically-suspended sample platen permits both the force-sensing probe and the tunneling tip to be scanned from above the sample, dipping into a ...


10
Stuart M Lindsay, Tianwei Jing: Scanning probe microscope. Molecular Imaging Corporation, D Alessandro & Ritchie, October 7, 1997: US05675154 (18 worldwide citation)

Features for incorporation with scanning probe microscopes are provided which may be used separately or together. The features include constructing the microscope with a hinged top housing providing easy access to the heart of the microscope; a self-aligning and torque limiting magnetic clutch coupl ...



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