1
Kister January: Knee probe having increased scrub motion. Microprobe, Kister January, JACOBS Ron, December 21, 2007: WO/2007/146186 (3 worldwide citation)

Improved probing is provided using a knee probe where the knee curves away from the probe axis and then curves back to connect to the probe tip, crossing the probe axis on the way to the tip. The resulting lateral offset between the probe tip and the probe axis is a key geometrical parameter for pre ...


2
KISTER January: SONDES DE CONTACT MULTIPLES, MULTIPLE CONTACT PROBES. MICROPROBE, KISTER January, UPDEGRAFF Samantha A, March 22, 2012: WO/2012/036922 (2 worldwide citation)

The present invention is a probe array for probing a device using a power probe pin with one or more projections or skates to enhance scrub performance and having a width greater than the input signal probe pin to avoid high current damage to the probe. An additional invention is the provision of a ...


3
Kister January: Probes with self-cleaning blunt skates for contacting conductive pads. Microprobe, Kister January, LODENKAMPER Robert, January 17, 2008: WO/2008/008232 (2 worldwide citation)

A probe having a conductive body and a contacting tip that is terminated by one or more blunt skates for engaging a conductive pad of a device under test (DUT) for performing electrical' testing. The contacting tip has a certain width and the blunt skate is narrower than the tip width. The skate is ...


4
Kister January: Probe skates for electrical testing of convex pa topologies. Microprobe, Kister January, LODENKAMPER Robert, August 7, 2008: WO/2008/094223 (2 worldwide citation)

A probe for engaging a conductive pad is provided. The probe includes a probe contact end for receiving a test current, a probe retention portion below the contact end, a block for holding the probe retention portion, a probe arm below the retention portion, a probe contact tip below the arm, and a ...


5
Jaquette James, Fahrner Steve, Kister January: Multipath interconnect with meandering contact cantilevers. K & S Interconnect, Jaquette James, Fahrner Steve, Kister January, SPLETZER Christopher M Sr, May 19, 2005: WO/2005/046004

An interconnect assembly (1) includes a number of interconnect stages (3) combined in a carrier structure (2). Each interconnect stage includes at least two contact sets (30) having an upwards pointing cantilever contact (31) and a downwards pointing cantilever contact (32). The cantilever contacts ...


6
Jaquette James, Tokraks Gene, Kister January: See-saw interconnect assembly with dielectric carrier grid providing spring suspension. K & S Interconnects, Jaquette James, Tokraks Gene, Kister January, SPLETZER Christopher M, August 18, 2005: WO/2005/076024

An interconnect assembly (1) includes a number of interconnects combined in a preferably planar dielectric carrier frame (4) having resilient portions acting as spring members in conjunction with their respective interconnect's rotational displacement during operational contacting. Each interconnect ...


7
Zhou Jiachun, Kister January: Test pin back surface in probe apparatus for low wear multiple contacting with conductive elastomer. K & S Interconnect, Zhou Jiachun, Kister January, ETKOWICZ Jacques L, September 9, 2005: WO/2005/083843

A probe apparatus (10) for preferably testing packaged circuit chips combines an anisotropic conductive elastomer (ACE) (40) with plunger pins (20) placed in between the ACE and the test contact (9). A plunger pin provides a contact end (23) for contacting the test contacts and a back end (22) confi ...


8
Kister January: Probe cards employing probes having retaining portions for potting in a potting region. Microprobe, Kister January, JACOBS Ron, April 17, 2008: WO/2008/045225

Method and apparatus using a retention arrangement for probes used for electrical testing of a device under test (DUT). The apparatus (10) has a number of probes (16) each of which has a connect end for applying a test signal, a retaining portion (20A), at least one arm portion and a contact tip for ...