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Victor B Kley: Scanning probe microscope assembly and method for making confocal, spectrophotometric, near-field, and scanning probe measurements and associated images. General Nanotechnology, Townsend and Townsend and Crew, May 15, 2001: US06232597 (76 worldwide citation)

A scanning probe microscope assembly and corresponding method for making confocal, spectrophotometric, near-field, and scanning probe measurements and forming associated images from the measurements.


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Vic B Kley: Scanning probe microscope assembly and method for making confocal, spectrophotometric, Near-Field, and Scanning probe measurements and associated images. General Nanotechnology L L C, Flehr Hohbach Test Albritton & Herbert, November 7, 2000: US06144028 (56 worldwide citation)

A scanning probe microscope assembly and corresponding method for making confocal, spectrophotometric, near-field, and scanning probe measurements and forming associated images from the measurements.


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Victor B Kley: Nanometer scale data storage device and associated positioning system. General Nanotechnology L L C, Flehr Hohbach Test Albritton & Herbert, May 12, 1998: US05751683 (53 worldwide citation)

A data storage system that includes a positioning system for positioning the write/read mechanism and the storage medium of the data storage device with respect to each other in first and second predefined directions. The positioning system comprises a positioning apparatus comprising microfabricate ...


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Victor B Kley: Nanometer scale data storage device and associated positioning system. General Nanotechnology L L C, Townsend & Townsend and Crew, June 26, 2001: US06252226 (53 worldwide citation)

A data storage system that includes a positioning system for positioning the write/read mechanism and the storage medium (


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Victor B Kley: Scanning probe/optical microscope with modular objective/probe and drive/detector units. General Nanotechnology L L C, Flehr Hohbach Test Albritton & Herbert, May 26, 1998: US05756997 (49 worldwide citation)

A scanning probe and optical microscope for inspecting an object the comprises a microscope stand to support the object, a modular objective/probe unit, a modular drive/detector unit, and an optical observation head. The modular objective/probe unit is removably attached to the microscope stand and ...


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Victor B Kley: Scanning probe microscope assembly and method for making spectrophotometric near-field optical and scanning measurements. General Nanotechnology L L C, Townsend and Townsend and Crew, July 24, 2001: US06265711 (34 worldwide citation)

A scanning probe microscope assembly that has an atomic force measurement (AFM) mode, a scanning tunneling measurement (STM) mode, a near-field spectrophotometry mode, a near-field optical mode, and a hardness testing mode for examining an object.


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Vic B Kley: Scanning probe microscope assembly and method for making confocal, spectrophotometric, near-field, and scanning probe measurements and associated images. General Nanotechnology L L C, Townsend and Townsend and Crew, February 4, 2003: US06515277 (33 worldwide citation)

A scanning probe microscope assembly and corresponding method for making confocal, spectrophotometric, near-field, and scanning probe measurements and forming associated images from the measurements.


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Vic B Kley: Scanning probe microscope assembly and method for making confocal, spectrophotometric, near-field, and scanning probe measurements and associated images. General Nanotechnology, Townsend and Townsend and Crew, August 28, 2001: US06281491 (31 worldwide citation)

A scanning probe microscope assembly and corresponding method for making confocal, spectrophotometric, near-field, and scanning probe measurements and forming associated images from the measurements.


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Victor B Kley: Scanning probe microscope assembly and method for making confocal, spectrophotometric, near-field, and scanning probe measurements and associated images. General Nanotechnology, Townsend and Townsend and Crew, June 5, 2001: US06242734 (29 worldwide citation)

A scanning probe microscope assembly and corresponding method for making confocal, spectrophotometric, near-field, and scanning probe measurements and forming associated images from the measurements.