1
David L Weldum, Clark A Bendall, Michael C Lesmerises, Thomas W Karpen, Jon R Salvati: Method and system for storing calibration data within image files. GE Inspection Technologies, Marjama & Bilinski, August 28, 2007: US07262797 (80 worldwide citation)

A system and method for storing, within an image transfer medium, an image and image-specific data associated with the image includes obtaining the image-specific data from a probe such as a borescope or endoscope, obtaining the corresponding image, choosing a specific image transfer medium, writing ...


2
Dongmin Yang, Theodore A Chilek, Thomas Karpen: System for providing zoom, focus and aperture control in a video inspection device. GE Inspection Technologies, GE Global Patent Operation, December 8, 2009: US07630148 (49 worldwide citation)

An optical system for a remote video inspection device including an elongated probe for inspection of target objects, comprising: an imager located distally within the probe, wherein the imager receives an image of the target object; a focus lens group located within the probe, the focus lens group ...


3
James J Delmonico, Thomas W Karpen, Joseph V Lopez, Richard A Monroe, Joshua Lynn Scott: Battery and power management for industrial inspection handset. GE Inspection Technologies, Global Patent Operation, Mark A Conklin, March 8, 2011: US07902990 (42 worldwide citation)

An industrial inspection handset is disclosed, comprising a battery assembly for providing power to the handset, wherein the battery assembly comprises a connector for connecting a battery charger, a battery circuit for communicating with a processor in the handset, and a battery charge indicator on ...


4
Raymond A Lia, Joshua L Scott: Method and apparatus for improving the operation of a remote viewing device by changing the calibration settings of its articulation servos. GE Inspection Technologies, Wall Marjama & Bilinski, November 14, 2006: US07134993 (26 worldwide citation)

The present invention features a remote viewing device that is capable of improving its operation by removing slack in its control cables and/or by increasing the range of motion of its viewing head. In one embodiment, the method for improving the operation involves removing at least a portion of th ...


5
Clark A Bendall, Raymond Lia, Jon R Salvati, Theodore A Chilek: Stereo-measurement borescope with 3-D viewing. GE Inspection Technologies, Marjama Muldoon Blasiak & Sullivan, July 21, 2009: US07564626 (22 worldwide citation)

Two stereo images are created by splitting a single image into two images using a field of view dividing splitter. The two images can be displayed side by side so that they can be viewed directly using stereopticon technology, heads-up display, or other 3-D display technology, or they can be separat ...


6
Clark A Bendall: Inspection apparatus method and apparatus comprising motion responsive control. GE Inspection Technologies, GE Global Patent Operation, Mark A Conklin, July 3, 2012: US08213676 (22 worldwide citation)

An inspection apparatus can process image data of one or more frames. In one aspect processing of image data can include processing for determination of a motion parameter. In one aspect an inspection apparatus can be controlled responsively to the processing of image data for determination of a mot ...


7
Clark Alexander Bendall, Guiju Song, Li Tao, Kevin George Harding, Thomas Karpen: Fringe projection system and method for a probe suitable for phase-shift analysis. GE Inspection Technologies, Global Patent Operation, Mark A Conklin, October 26, 2010: US07821649 (16 worldwide citation)

A probe includes an insertion tube and a plurality of light emitters disposed on the distal end of the insertion tube. The probe further includes at least one intensity modulating element through which light from the plurality of light emitters is passed to project a plurality of fringe sets onto a ...


8
Clark Alexander Bendall, Kevin George Harding, Guiju Song, Li Tao, Ming Jia, Xinjun Wan: Fringe projection system and method for a probe using a coherent fiber bundle. GE Inspection Technologies, Global Patent Operation, Mark A Conklin, October 12, 2010: US07812968 (14 worldwide citation)

A probe is presented that includes a light source, a coherent fiber bundle, and a pattern selector. The pattern selector is disposed between the light source and the proximal end of the coherent fiber bundle. The pattern selector includes at least one patterned zone through which light from the ligh ...


9
Thomas Eldred Lambdin, Bradford Morse, Clark A Bendall, Edward B Hubben, Thomas W Karpen, Bruce A Pellegrino: Article inspection apparatus. GE Inspection Technologies, Global Patent Operation, Catherine J Toppin, February 5, 2013: US08368749 (13 worldwide citation)

An inspection apparatus can be operated to collect files during performance of an inspection. An inspection apparatus can associate metadata to a collected file. In one embodiment metadata associated with a collected file can include an article identifier. In one embodiment metadata that is associat ...


10
Clark Alexander Bendall, Michael M Ball: Method of determining the profile of a surface of an object. GE Inspection Technologies, Global Patent Operation, Mark A Conklin, June 24, 2014: US08760447 (10 worldwide citation)

A method of determining the profile of a surface of an object is disclosed that does not require that the video inspection device be at a certain angle relative to the surface when an image of the surface is obtained (e.g., allows non-perpendicular captures of the image 30). The method determines a ...