1
John T Martin: Waveguide with adjustable backshort. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, April 15, 2003: US06549106 (251 worldwide citation)

A waveguide assembly including a waveguide, a backshort member, and an adjustment member, where the adjustment member is capable of receiving or input and transforming it into an output that causes the backshort member to be displaced in response to said input.


2
Larry R Lockwood, Kimberly R Gleason, Eric W Strid: Wafer probe. Cascade Microtech, Dellett Smith Hill & Bedell, September 29, 1987: US04697143 (193 worldwide citation)

A wafer probe is provided having metallic transmission lines mounted on a tapered alumina substrate generally surrounded by microwave absorbing material. The probe provides for on-wafer measurements of small planar devices at frequencies from DC to at least 18 GHz with low inductance, and with const ...


3
Edward M Godshalk, Jeffrey A Williams, Jeremy N Burr: High-frequency probe tip assembly. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, April 9, 1996: US05506515 (149 worldwide citation)

A probe suitable for low-loss microwave frequency operation has a tip assembly including a semi-rigid coaxial cable having a Teflon.TM. dielectric for temperature stability and a freely-suspended end. On this end a semicylindrical recess is formed defining a shelf along which an inner finger and out ...


4
Jeremy Burr, Gregory Nordgren, Eric W Strid, Kimberly R Gleason: Coaxial wafer probe with tip shielding. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, October 15, 1996: US05565788 (140 worldwide citation)

A shielded microwave probe tip assembly includes an end of a coaxial cable coupled to probe fingers forming a coplanar controlled impedance microwave transmission line where the ground probe fingers are interconnected by a shield member that is spaced apart from the signal line probe finger but is p ...


5
Randy J Schwindt: Low-current probe card with reduced triboelectric current generating cables. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, March 17, 1998: US05729150 (129 worldwide citation)

A low-current probe card for measuring currents down to the femtoamp region includes a dielectric board, such as of glass-epoxy material, forming an opening. A plurality of probing devices, such as ceramic blades, are edge-mounted about the opening so that the probing elements or needles included th ...


6
K Reed Gleason, Keith E Jones, Eric W Strid: Microwave wafer probe having replaceable probe tip. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, July 18, 1989: US04849689 (128 worldwide citation)

A microwave wafer probe having a replaceable planar transmission line probe tip which detachably connects to a planar transmission line circuit board within the probe head. The circuit board may include passive and/or active electrical circuit components interconnecting its conductors which, due to ...


7
Randy Schwindt: Probe station having conductive coating added to thermal chuck insulator. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, March 11, 1997: US05610529 (123 worldwide citation)

A probe station suitable for low noise measurements includes a chuck for supporting a test device and a supporting surface for the test device. The probe station has means for controlling the temperature in the vicinity of the test device by sensing the temperature and, in response to the sensing, a ...


8
Eric W Strid, Kimberly R Gleason: Wafer probe. Cascade Microtech, Dellett Smith Hill and Bedell, May 2, 1989: US04827211 (123 worldwide citation)

A wafer probe for accessing bonding pads on a planar device includes contact pads mounted on one edge of the under side of a dielectric substrate board and arranged to align with the bonding pads to be accessed. Coplanar ground and signal conductors deposited on the under side of the substrate board ...


9
Warren K Harwood, Martin J Koxxy, Paul A Tervo: Wafer probe station with integrated environment control enclosure. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, November 30, 1993: US05266889 (119 worldwide citation)

A wafer probe station is equipped with a compact, integrated controlled-environment enclosure providing EMI shielding, substantially hermetic sealing for a dry purge gas for low-temperature testing, and a dark environment. The sealing isolation of the wafer chuck and test probe provided by the enclo ...


10
K Reed Gleason, Kenneth R Smith, Mike Bayne: Membrane probing system with local contact scrub. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, June 22, 1999: US05914613 (118 worldwide citation)

A membrane probing assembly includes a support element having an incompressible forward support tiltably coupled to a rearward base and a membrane assembly, formed of polyimide layers, with its central region interconnected to the support by an elastomeric layer. Flexible traces form data/signal lin ...