1
Toshiyuki Kiyokawa, Hisao Hayama: IC test equipment. Advantest Corporation, Staas & Halsey, December 15, 1992: US05172049 (126 worldwide citation)

In IC test equipment in which an IC element sucked by an air chuck is carried in the horizontal direction by an X-Y transport unit and the air chuck is lowered toward a test head to load the IC element onto a socket provided on a performance board for test, the socket has a contact housing room defi ...


2
Hiroaki Satomura, Shinya Fujita, Junichi Ukita, Katsuhiko Watanabe: Wavelength dispersion probing system. Advantest Corporation, Dellett & Walters, March 28, 2006: US07020360 (94 worldwide citation)

A wavelength dispersion probing system for determining a value of wavelength dispersion and its sign and reducing the trouble and time required for this determination. This wavelength dispersion probing system comprises light sources 10, 12, light attenuators 14, 16, optical multiplexer 18, phase mo ...


3
Masahiro Ishida, Takahiro Yamaguchi, Marco Tilgner: Method and device for compressing and expanding data pattern. Advantest Corporation, David N Lathrop Esq, Gallagher & Lathrop, December 9, 2003: US06661839 (92 worldwide citation)

There are provided methods each of which is for efficiently compressing a test pattern to be applied to an IC for testing. The number of data changes &phgr; and a data entropy H of a pattern for each pin of an IC are obtained and then the test pattern is divided and the divided patterns are distribu ...


4
Akihiro Fujimoto: Test head cooling system. Advantest Corporation, Knobbe Martens Olson & Bear, July 1, 1997: US05644248 (85 worldwide citation)

The present invention provides a test head cooling system for cooling test heads of a semiconductor IC test apparatus in an enclosed structure. A sealed housing is provided in a test head wherein an air duct is formed in a wall of the sealed box so that cooling air flow effectively. Several thousand ...


5
Tohru Abiko: Method for detecting a contact position between an object to be measured and measuring pins. Advantest Corporation, Oblon Spivak McClelland Maier & Neustadt P C, February 20, 2001: US06191596 (80 worldwide citation)

A method is disclosed for detecting a contact position between an object under measurement and measuring pins. A semiconductor test device issues an instruction to a wafer prober control unit to control raising and down of a stage. When raising the stage in units of a predetermined distance a and de ...


6
Mark W Klug, Thomas E Toth, Theodore C Guenther, Martin Twite, Kazuyuki Tsurishima, Mitsuaki Tani, Minoru Baba, Teruaki Sakurada: Apparatus for automatic handling. Advantest Corporation, Knobbe Martens Olson & Bear, May 17, 1994: US05313156 (75 worldwide citation)

An integrated circuit (IC) device test handler which is adaptable to receive various customer tray configurations and automatically test the ICs within. The test handler comprises a customer tray magazine input area, a load section, a soak chamber, a test section, an unsoak chamber and an unload are ...


7
Yokichi Hayashi, Hiroshi Tsukahara, Katsumi Ochiai, Mashuhiro Yamada, Naoyoshi Watanabe: Variable delay circuit. Advantest Corporation, Staas & Halsey, August 8, 1995: US05440260 (73 worldwide citation)

The gate of a CMOS transistor formed by a series connection of p-channel and n-channel FETs 21 and 22 is connected to an input terminal 23, and the drain of the CMOS transistor is connected to an output terminal 24. The source of the FET 21 is connected to a positive power supply terminal 20 via par ...


8
Kazunari Suga, Akihiro Fujimoto: Printed circuit board with electronic devices mounted thereon. Advantest Corporation, Staas & Halsey, April 18, 2000: US06052284 (69 worldwide citation)

A cooler-equipped printed circuit board, in which electronic devices arranged in a matrix form on the printed circuit board are covered with a sealed case held in liquidtight contact with the board and having a coolant channel from an inlet port and an outlet port made in the case. Barriers are prov ...


9
Wataru Doi: Spectrum analyzer. Advantest Corporation, Staas & Halsey, October 31, 2000: US06140809 (68 worldwide citation)

A received signal is converted in a frequency converter, an output from which is again frequency converted. The second converted output is detected by a detector and then converted into a digital signal to be stored in a memory. A spectrum display is provided by a display. A frequency sweep of local ...


10