1
Jack Sacks, Ralph Weisner: Z-axis height measurement system. View Engineering, Bogucki Scherlacher Mok & Roth, May 10, 1988: US04743771 (135 worldwide citation)

This invention concerns an optical system for use with a television camera for detecting the surface location of an object. A preferred optical image having a distinct, unique, recognizable pattern is projected on a surface along a defined path that ultimately falls on an imaging sensor associated w ...


2
Richard A Hubach, Gary L DeZotell, Jack Sacks: Pattern recognition apparatus and method. View Engineering, Singer & Singer, April 29, 1980: US04200861 (113 worldwide citation)

Video informatin obtained in real time is clocked and digitized according to light intensity. Changing light intensities are adaptively determined to vary the threshold level for determining black and white signals. The scene to be used as a reference is first recorded in a fine format and then in a ...


3
Jack Sacks, Valerie A Liudzius, Gary DeZotell, Richard E DeKlotz: High speed pattern recognizer. View Engineering, Bogucki Scherlacher Mok & Roth, April 5, 1988: US04736437 (113 worldwide citation)

An apparatus and method for storing a reference scene and a scene under search in separate addressable memories. The reference scene is addressed along a scan line at a selected angle giving the impression that the reference memory has been rotated. The search area information is convolved with a st ...


4
Ronald J Svetkoff, Donald K Rohrer, Robert W Kelley: Triangulation-based 3D imaging and processing method and system. View Engineering, Brooks & Kushman P C, August 13, 1996: US05546189 (97 worldwide citation)

A triangulation-based method and system for high speed 3D and gray scale imaging and associated pre-processing of digitized information allows for estimation or filtering of height and gray scale values based upon the confidence level of the information obtained from a pair of sensors and also based ...


5
Donald J Svetkoff, Donald K Rohrer, David A Noblett, Robert L Jackson: Method and system for triangulation-based, 3-D imaging utilizing an angled scaning beam of radiant energy. View Engineering, Brooks & Kushman P C, April 1, 1997: US05617209 (53 worldwide citation)

A method and system for three-dimensional imaging of objects, including integrated circuit interconnections to improve the efficiency of triangulation-based laser line scanning systems. A scanning beam is incident at a normal angle to the X,Y inspection plane with the scan line oriented at 45.degree ...


6
Ralph M Weisner: Systems and methods for illuminating objects for vision systems. View Engineering, Bogucki Scherlacher Mok & Roth, November 10, 1987: US04706168 (47 worldwide citation)

An illumination system, particularly suitable for use with automatic vision systems employing an image sensing device or system, illuminates an object under analysis with the cone of light that may cover 360.degree. or only an arc segment about a part of the object under analysis. Light from a ring ...


7
Valerie A Liudzius, Ralph M Weisner, Takashi Kamiharako, Iwami Uramoto: Semiconductor device inspection system. View Engineering, Kaijo Denki, Merchant Gould Smith Edell Welter & Schmidt, October 3, 1989: US04872052 (46 worldwide citation)

A semiconductor device inspection system capable of objectively accomplishing visual image inspection of a semiconductor device and minimizing error in the inspection, to thereby effectively carry out the inspection with high accuracy and at high speed. The system includes a low magnification image ...


8
Richard A Hubach, Gary L DeZotell, Jack Sacks: Pattern recognition apparatus and method. View Engineering, Singer & Singer, May 24, 1983: US04385322 (39 worldwide citation)

Video information obtained in real time is clocked and digitized according to light intensity. Changing light intensities are adaptively determined to vary the threshold level for determining black and white signals. The scene to be used as a reference is first recorded in a fine format and then in ...


9
Jack Sacks: Adaptive video processor. View Engineering, Singer and Singer, November 10, 1981: US04300164 (30 worldwide citation)

In a pattern recognition system the video output signal is a signal representative of either black or white. The shading effect of the video camera is minimized by using a high pass filter to accentuate the high frequency components of the signal by partially differentiating the substantially square ...


10
Robert Lea Jackson, Robert Cottle Boman: Grid array inspection system and method. View Engineering, Merchant Gould Smith Edell Welter & Schmidt P A, July 29, 1997: US05652658 (27 worldwide citation)

A high speed, high accuracy, three-dimensional inspection system for ball and pin grid assemblies. The system uses a three-dimensional scanner to gather data which is analyzed to yield height position measurements along with overall packaged dimensions. The grid array to be scanned is placed upon a ...