Method and apparatus using a retention arrangement for probes used for electrical testing of a device under test (DUT). The apparatus (10) has a number of probes (16) each of which has a connect end for applying a test signal, a retaining portion (20A), at least one arm portion and a contact tip for making an electrical contact with the DUT. A retention arrangement has a tip holder for holding each of the probes (16) by its contacting tip and a plate with openings for holding each of the probes (16) below the retaining portion. The retaining portion of each of the probes is potted in a potting region defined above the plate with the aid of a potting agent (43). The apparatus (10) can be used with space transformers, a variety of probes of different geometries and scrub motion characteristics and is well-suited for use in probe card apparatus under tight pitch and small tolerance requirements.