3849728 is referenced by 113 patents and cites 2 patents.

A probe card for testing integrated circuit patterns having contacts deployed thereon, the patterns being formed in a microelectronic substrate. The card includes an opening providing access to a pattern and a ring of spaced conductive pads surrounding the opening. Anchored on selected pads are needle-holders having needles extending therefrom to engage the contacts in the pattern being tested, all needle extensions being of the same length and all needle points lying in a common plane. In order to facilitate attachment of each needle-holder to its pad on the card and to orient the holder before such attachment so that the needle point is precisely aligned with the related contact, an assembly fixture is provided.

Fixed point probe card and an assembly and repair fixture therefor
Application Number
Publication Number
Application Date
August 21, 1973
Publication Date
November 19, 1974
Evans Arthur
Wentworth Laboratories
G01r 01/06
G01r 31/02
G01R 31/28
G01R 01/73
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