10114042 cites 6 patents.

A probe for a vertical probe card includes an unsupported base portion that extends from the vertical probe card, a cantilevered portion that extends substantially perpendicular to the unsupported base portion and a contact portion that includes a tip. The cantilevered portion has a first thickness at an end adjacent the unsupported base portion and a second thickness at an end adjacent the contact portion, the second thickness being less than the first thickness.

Title
Vertical probe card
Application Number
15/16745
Publication Number
10114042 (B2)
Application Date
February 5, 2016
Publication Date
October 30, 2018
Inventor
Faheem Mohamedi
Arlington
TX, US
Ming Fang
Plano
TX, US
Agent
Frank D Cimino
Charles A Brill
Kenneth Liu
Assignee
TEXAS INSTRUMENTS INCORPORATED
TX, US
IPC
G01R 1/067
G01R 1/073
G01R 31/00
View Original Source