09183946 cites 9 patents.

A method of storing data in a nonvolatile memory device comprises performing a program operation on target memory cells among multiple memory cells, performing a first verify operation to determine whether the target memory cells are in a program pass state or a program fail state, and as a consequence of determining that the target memory cells are in the program pass state, performing a second verify operation to determine whether the target memory cells exhibit a program error symptom.

Title
Method of storing data in nonvolatile memory device and method of testing nonvolatile memory device
Application Number
14/153140
Publication Number
9183946 (B2)
Application Date
January 13, 2014
Publication Date
November 10, 2015
Inventor
Won Chul Lee
Yongin-Si
KR
Oh Suk Kwong
Seoul
KR
Jong Chul Lee
Hwaseong-Si
KR
Myoung Won Yoon
Suwon-Si
KR
Eun Kyoung Kim
Hwaseong-Si
KR
Agent
Volentine & Whitt PLLC
Assignee
Samsung Electronics
KR
IPC
G11C 29/50
G11C 29/08
G11C 16/34
G11C 16/06
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