09014792 is referenced by 1 patents and cites 9 patents.

A system that incorporates teachings of the present disclosure may include, for example, a method for aligning first and second light signals on an optical path directed to a target, where the first light signal provides a visualization of the target, and a portion of the second light signal reflects from at least one subsurface of the target. The method also includes aligning a first focal point of the first light signal and a second focal point of the second light signal, where the first focal point is at least in a first proximate location of the second focal point, and adjusting a first position of the first and second focal points to be in at least a second proximate location of the target without adjusting the at least first proximate location of the first focal point relative to the second focal point. Other embodiments are disclosed.

Title
Method and apparatus for analyzing subsurfaces of a target material
Application Number
13/971950
Publication Number
9014792 (B2)
Application Date
August 21, 2013
Publication Date
April 21, 2015
Inventor
Raymond A Lia
Auburn
NY, US
Ervin Goldfain
Syracuse
NY, US
Agent
Ed Guntin
Guntin & Gust
Assignee
Welch Allyn
NY, US
IPC
G01B 9/02
A61B 5/00
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