08723546 is referenced by 4 patents and cites 280 patents.

The present invention is a set of layered probes that make electrical contact to a device under test. The layered probes are disposed within openings of at least one guide plate. The guide plate surrounds the probes via the openings. The layered probes have a base end, an opposing tip end and a shaft connecting the base end to the tip end. The base end can have a positioning device that extends away from the base end.

Title
Vertical guided layered probe
Application Number
12/715896
Publication Number
8723546 (B2)
Application Date
March 2, 2010
Publication Date
May 13, 2014
Inventor
January Kister
Portola Valley
CA, US
Agent
Peacock Myers P C
Philip D Askenazy
Deborah A Peacock
Assignee
MicroProbe
CA, US
IPC
G01R 1/067
G01R 1/073
G01R 31/20
G01R 31/00
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