08486545 is referenced by 2 patents and cites 34 patents.

Systems and methods for flaw detection and monitoring at elevated temperatures with wireless communication using surface embedded, monolithically integrated, thin-film, magnetically actuated sensors, and methods for fabricating the sensors. The sensor is a monolithically integrated, multi-layered (nano-composite), thin-film sensor structure that incorporates a thin-film, multi-layer magnetostrictive element, a thin-film electrically insulating or dielectric layer, and a thin-film activating layer such as a planar coil. The method for manufacturing the multi-layered, thin-film sensor structure as described above, utilizes a variety of factors that allow for optimization of sensor characteristics for application to specific structures and in specific environments. The system and method integrating the multi-layered, thin-film sensor structure as described above, further utilizes wireless connectivity to the sensor to allow the sensor to be mounted on moving components within the monitored assembly.

Title
Systems and methods for flaw detection and monitoring at elevated temperatures with wireless communication using surface embedded, monolithically integrated, thin-film, magnetically actuated sensors, and methods for fabricating the sensors
Application Number
11/540495
Publication Number
8486545 (B2)
Application Date
September 28, 2006
Publication Date
July 16, 2013
Inventor
James A Moryl
Helotes
TX, US
Stephen J Hudak Jr
Helotes
TX, US
Glenn M Light
San Antonio
TX, US
Bruce R Lanning
Littleton
CO, US
Agent
Kammer Browning PLLC
Assignee
Southwest Research Institute
TX, US
IPC
H01L 41/06
G01R 33/18
G01N 29/04
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