08427635 is referenced by 1 patents and cites 13 patents.

Methods and apparatus for standardizing quantitative measurements from a microscope system. The process includes a calibration procedure whereby an image of a calibration slide is obtained through the optics of the microscope system. The calibration slide produces a standard response, which can be used to determine a machine intrinsic factor for the particular system. The machine intrinsic factor can be stored for later reference. In use, images are acquired of a target sample and of the excitation light source. The excitation light source sample is obtained using a calibration instrument configured to sample intensity. The calibration instrument has an associated correction factor to compensate its performance to a universally standardized calibration instrument. The machine intrinsic factor, sampled intensity, and calibration instrument correction factor are usable to compensate a quantitative measurement of the target sample in order to normalize the results for comparison with other microscope systems.

Title
Method and system for standardizing microscope instruments
Application Number
13/360532
Publication Number
8427635 (B2)
Application Date
January 27, 2012
Publication Date
April 23, 2013
Inventor
Gregory R Tedeschi
Cromwell
CT, US
Maciej P Zerkowski
Old Lyme
CT, US
Robert Pinard
New Haven
CT, US
Jason Christiansen
Glastonbury
CT, US
Agent
Foley & Lardner
Daniel R Shelton
Gilberto M Villacorta
Assignee
HistoRx
CT, US
IPC
G01J 1/00
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