08415963 is referenced by 11 patents and cites 262 patents.

A vertically folded probe is provided that can provide improved scrub performance in cases where the probe height is limited. More specifically, such a probe includes a base and a tip, and an arm extending from the base to the tip as a single continuous member. The probe arm is vertically folded, such that it includes three or more vertical arm portions. The vertical arm portions have substantial vertical overlap, and are laterally displaced from each other. When such a probe is vertically brought down onto a device under test, the probe deforms. During probe deformation, at least two of the vertical arm portions come into contact with each other. Such contact between the arm portions can advantageously increase the lateral scrub motion at the probe tip, and can also advantageously reduce the probe inductance.

Title
Low profile probe having improved mechanical scrub and reduced contact inductance
Application Number
13/108368
Publication Number
8415963 (B2)
Application Date
May 16, 2011
Publication Date
April 9, 2013
Inventor
January Kister
Portola Valley
CA, US
Agent
Peacock Myers P C
Samantha A Updegraff
Deborah A Peacock
Assignee
MicroProbe
CA, US
IPC
G01R 31/00
G01R 31/20
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