08317105 is referenced by 143 patents and cites 388 patents.

A method of unlocking restricted extended classes of features and functionalities embodied within an optical scanning system having an extended programming mode. The method involves providing an optical scanning system supporting baseline classes of features and functionalities, and having an extended feature class programming mode for programming extended classes of features and functionalities, in addition to the baseline classes of features and functionalities. A license key is assigned to the optical scanning system, for unlocking at least one of the extended classes of features and functionalities, and programming the optical scanning system to operate with at least one of the extended classes of feature and functionalities, in addition to the baseline classes of features and functionalities. A license is procured to unlock and use at least one of the extended classes of feature and functionalities, and obtaining said license key assigned to the optical scanning system. The said optical scanning system is caused to operate in the extended feature class programming. While the optical scanning system is operating in the extended feature class programming, the license key is used to unlock at least one of the extended classes of features and functionalities, and program the optical scanning system to operate with at least one of the extended classes of feature and functionalities, in addition to the baseline classes of features and functionalities.

Title
Optical scanning system having an extended programming mode and method of unlocking restricted extended classes of features and functionalities embodied therewithin
Application Number
13/156746
Publication Number
8317105 (B2)
Application Date
June 9, 2011
Publication Date
November 27, 2012
Inventor
David M Wilz Sr
Sewell
NJ, US
Christopher Allen
Plainsboro
NJ, US
Shawn De Foney
Haddon Heights
NJ, US
Sudhin Mandal
Ardmore
PA, US
C Harry Knowles
Hanover
NH, US
Michael V Miraglia
Hamilton
NJ, US
Taylor Smith
Haddon Township
NJ, US
Jie Ren
Suzhou
CN
Weizhen Yan
Clementon
NJ, US
Patrick Giordano
Blackwood
NJ, US
Ka Man Au
Philadelphia
PA, US
Michael Veksland
Marlton
NJ, US
Xiaoxun Zhu
Marlton
NJ, US
Anatoly Kotlarsky
Churchville
PA, US
Agent
Thomas J Perkowski Esq P C
Assignee
Metrologic Instruments
NJ, US
IPC
G06K 7/10
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