08001516 is referenced by 51 patents and cites 143 patents.

A method and system are described to reduce process variation as a result of the semiconductor processing of films in integrated circuit manufacturing processes. The described methods use process variation and electrical impact to modify the design and manufacture of integrated circuits.

Title
Characterization and reduction of variation for integrated circuits
Application Number
12/131833
Publication Number
8001516 (B2)
Application Date
June 2, 2008
Publication Date
August 16, 2011
Inventor
David White
Cambridge
MA, US
Vikas Mehrotra
Fremont
CA, US
Taber H Smith
Fremont
CA, US
Agent
Vista IP Law Group
Assignee
Cadence Design Systems
CA, US
IPC
G06F 11/22
G06F 9/455
G06F 17/50
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