07990642 is referenced by 23 patents and cites 56 patents.

Various embodiments of the present invention provide systems and methods for validating elements of storage devices. A an example, various embodiments of the present invention provide semiconductor devices that include a write path circuit, a read path circuit and a validation circuit. The write path circuit is operable to receive a data input and to convert the data input into write data suitable for storage to a storage medium. The read path circuit is operable to receive read data and to convert the read data into a data output. The validation circuit is operable to: receive the write data, augment the write data with a first noise sequence to yield a first augmented data series; and augment a derivative of the first augmented data series with a second noise sequence to yield the read data.

Title
Systems and methods for storage channel testing
Application Number
12/425757
Publication Number
7990642 (B2)
Application Date
April 17, 2009
Publication Date
August 2, 2011
Inventor
Hao Zhong
San Jose
CA, US
Weijun Tan
Longmont
CO, US
Hongwei Song
Longmont
CO, US
Shaohua Yang
Santa Clara
CA, US
George Mathew
San Jose
CA, US
Yuan Xing Lee
San Jose
CA, US
Agent
Hamilton DeSanctis & Cha
Assignee
LSI Corporation
CA, US
IPC
G11B 27/36
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