07954080 is referenced by 8 patents and cites 2 patents.

A method and system for de-embedding an on-wafer device is disclosed. The method comprises representing the intrinsic characteristics of a test structure using a set of ABCD matrix components; determining the intrinsic characteristics arising from the test structure; and using the determined intrinsic characteristics of the test structure to produce a set of parameters representative of the intrinsic characteristics of a device-under-test (“DUT”).

Title
Method and apparatus for de-embedding on-wafer devices
Application Number
12/42606
Publication Number
7954080 (B2)
Application Date
March 5, 2008
Publication Date
May 31, 2011
Inventor
Sally Liu
Hsin-Chu
TW
Tzu Jin Yeh
Hsinchu
TW
Hsiao Tsung Yen
Tainan
TW
Agent
Haynes and Boone
Assignee
Taiwan Semiconductor Manufacturing Company
TW
IPC
G06F 17/50
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