07944224 is referenced by 8 patents and cites 211 patents.

A vertically folded probe is provided that can provide improved scrub performance in cases where the probe height is limited. More specifically, such a probe includes a base and a tip, and an arm extending from the base to the tip as a single continuous member. The probe arm is vertically folded, such that it includes three or more vertical arm portions. The vertical arm portions have substantial vertical overlap, and are laterally displaced from each other. When such a probe is vertically brought down onto a device under test, the probe deforms. During probe deformation, at least two of the vertical arm portions come into contact with each other. Such contact between the arm portions can advantageously increase the lateral scrub motion at the probe tip, and can also advantageously reduce the probe inductance.

Title
Low profile probe having improved mechanical scrub and reduced contact inductance
Application Number
12/684272
Publication Number
7944224 (B2)
Application Date
January 8, 2010
Publication Date
May 17, 2011
Inventor
January Kister
Portola Valley
CA, US
Agent
Peacock Myers P C
Samantha A Updegraff
Deborah A Peacock
Assignee
MicroProbe
CA, US
IPC
G01R 31/067
G01R 31/20
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