07656763 is referenced by 133 patents and cites 10 patents.

A method is disclosed for performing a defect scan for a disk drive. Data is recorded on a first data area of a disk substantially free from defects and on a second data area of the disk substantially affected by at least one defect. A defect scan parameter is initialized with an initial setting. The first data area is read to determine a first defect threshold, and the second data area is read to determine a second defect threshold. A margin is saved representing a difference between the first and second defect thresholds. The setting for the defect scan parameter is adjusted, and the elements of reading the first and second data areas and saving a corresponding margin are repeated at least once. A setting is then selected for the defect scan parameter in response to the saved margins.

Title
Calibrating a defect scan parameter for a disk drive
Application Number
11/757824
Publication Number
7656763 (B1)
Application Date
June 4, 2007
Publication Date
February 2, 2010
Inventor
Teik Ee Yeo
Trabuco Canyon
CA, US
Ming Jin
Lake Forest
CA, US
Agent
Howard H Sheerin Esq
Assignee
Western Digital Technologies
CA, US
IPC
G11B 5/09
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