07615738 is referenced by 7 patents and cites 205 patents.

A scanning probe microscope assembly that has an atomic force measurement (AFM) mode, a scanning tunneling measurement (STM) mode, a near-field spectrophotometry mode, a near-field optical mode, and a hardness testing mode for examining an object.

Title
Scanning probe microscope assembly and method for making spectrophotometric, near-field, and scanning probe measurements
Application Number
11/355260
Publication Number
7615738 (B2)
Application Date
February 14, 2006
Publication Date
November 10, 2009
Inventor
Victor B Kley
Berkeley
CA, US
Agent
Townsend and Townsend and Crew
Assignee
General Nanotechnology
CA, US
IPC
H01J 3/14
G21K 7/00
G01N 23/00
G01B 5/28
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