07403028 is referenced by 26 patents and cites 1206 patents.

A test structure including a differential gain cell and a differential signal probe include compensation for the Miller effect reducing the frequency dependent variability of the input impedance of the test structure.

Title
Test structure and probe for differential signals
Application Number
11/710149
Publication Number
7403028 (B2)
Application Date
February 22, 2007
Publication Date
July 22, 2008
Inventor
Richard Campbell
Portland
OR, US
Agent
Chernoff Vilhauer McClung & Stenzel
Assignee
Cascade Microtech
OR, US
IPC
G01R 31/02
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