07383521 is referenced by 263 patents and cites 100 patents.

A method and system are described to reduce process variation as a result of the semiconductor processing of films in integrated circuit manufacturing processes. The described methods use process variation and electrical impact to modify the design and manufacture of integrated circuits.

Title
Characterization and reduction of variation for integrated circuits
Application Number
11/5651
Publication Number
7383521 (B2)
Application Date
December 6, 2004
Publication Date
June 3, 2008
Inventor
David White
Cambridge
MA, US
Vikas Mehrotra
Fremont
CA, US
Taber H Smith
Fremont
CA, US
Agent
Bingham McCutchen
Assignee
Cadence Design Systems
CA, US
IPC
G06F 17/50
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