07271603 is referenced by 36 patents and cites 793 patents.

A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies. The probe measurement system preferably includes a probe having a conductive path extending between the first and second surfaces of a membrane and a probe contact electrically connected to the conductive path.

Title
Shielded probe for testing a device under test
Application Number
11/391895
Publication Number
7271603 (B2)
Application Date
March 28, 2006
Publication Date
September 18, 2007
Inventor
John Martin
Portland
OR, US
Mike Andrews
Cornelius
OR, US
Tim Lesher
Portland
OR, US
K Reed Gleason
Portland
OR, US
Agent
Chernoff Vilhauer McClung & Stenzel
Assignee
Cascade Microtech
OR, US
IPC
G01R 31/02
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