07250779 is referenced by 26 patents and cites 573 patents.

A probe assembly suitable for making test measurements using test signals having high currents. The disclosed probe assembly provides for a test signal exhibiting relatively low inductance when compared to existing probe assemblies by preferably reducing the electrical path distance between the test instrumentation and the electrical device being tested.

Title
Probe station with low inductance path
Application Number
10/672655
Publication Number
7250779 (B2)
Application Date
September 25, 2003
Publication Date
July 31, 2007
Inventor
Clarence E Cowan
Newberg
OR, US
John Dunklee
Tigard
OR, US
Agent
Chernoff Vilhauer McClung & Stenzel
Assignee
Cascade Microtech
OR, US
IPC
G01R 31/28
G01R 31/02
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