07233160 is referenced by 25 patents and cites 768 patents.

The present invention relates to a probe for testing of integrated circuits or other microelectronic devices.

Title
Wafer probe
Application Number
9/997501
Publication Number
7233160 (B2)
Application Date
November 19, 2001
Publication Date
June 19, 2007
Inventor
Mike Andrews
Hillsboro
OR, US
John Martin
Portland
OR, US
Leonard Hayden
Beaverton
OR, US
Agent
Chernoff Vilhauer McClung & Stenzel
Assignee
Cascade Microtech
OR, US
IPC
G01R 1/073
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