06992932 is referenced by 309 patents and cites 129 patents.

The present invention is a method, circuit and system for determining a reference voltage to be used in reading cells programmed to a given program state. Some embodiments of the present invention relate to a system, method and circuit for establishing a set of operating reference cells to be used in operating (e.g. reading) cells in a NVM block or array. As part of the present invention, at least a subset of cells of the NVM block or array may be read and the number of cells found at a given state associated with the array may be compared to one or more check sum values obtained during programming of the at least a subset of cells. A Read Verify threshold reference voltage associated with the given program state or associated with an adjacent state may be adjusted based on the result of the comparison.

Title
Method circuit and system for read error detection in a non-volatile memory array
Application Number
10/695457
Publication Number
6992932 (B2)
Application Date
October 29, 2003
Publication Date
January 31, 2006
Inventor
Guy Cohen
Yaad
IL
Agent
Eitan Law Group
Assignee
Saifun Semiconductors
IL
IPC
G11C 16/06
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