06963505 is referenced by 117 patents and cites 124 patents.

The present invention is a method, circuit and system for determining a reference voltage. Some embodiments of the present invention relate to a system, method and circuit for establishing a set of operating reference cells to be used in operating (e.g. reading) cells in an NVM block or array. As part of the present invention, at least a subset of cells of the NVM block or array may be read using each of two or more sets of test reference cells, where each set of test reference cells may generate or otherwise provide reference voltages at least slightly offset from each other set of test reference cells. For each set of test reference cells used to read at least a subset of the NVM block, a read error rate may be calculated or otherwise determined. A set of test reference cells associated with a relatively low read error rate may be selected as the set of operating reference cells to be used in operating (e.g. reading) other cells, outside the subset of cells, in the NVM block or array. In a further embodiment, the selected set of test reference cells may be used to establish an operating set of reference cells having reference voltages substantially equal to those of the selected test set.

Title
Method circuit and system for determining a reference voltage
Application Number
10/695448
Publication Number
6963505 (B2)
Application Date
October 29, 2003
Publication Date
November 8, 2005
Inventor
Guy Cohen
Yaad
IL
Agent
Eitan Law Group
Assignee
Aifun Semiconductors
IL
IPC
G11C 016/06
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