06815963 is referenced by 65 patents.

A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.

Title
Probe for testing a device under test
Application Number
10/445099
Publication Number
6815963 (B2)
Application Date
May 23, 2003
Publication Date
November 9, 2004
Inventor
Amr M E Safwat
Cairo
US
Leonard Hayden
Beaverton
OR, US
John Dunklee
Tigard
OR, US
John Martin
Portland
OR, US
Mike Andrews
Cornelius
OR, US
Eric W Strid
Portland
OR, US
Tim Lesher
Portland
OR, US
K Reed Gleason
Portland
OR, US
Agent
Chernoff Vilhauer McClung & Stenzel
US
Assignee
Cascade Microtech
OR, US
IPC
G01R 31/00
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