06697979 is referenced by 119 patents and cites 2 patents.

An arrangement and a method are provided for replacing defective units, which can be any desired unit of a chip (e.g., arithmetic and logic units), with a function unit. The arrangement and the method provide for performing self-tests more easily, less expensively and before or during a running of an application program. Fault tolerance is greatly enhanced during operation, which is advantageous for failure-critical applications such as in power plants, aviation, space travel or the military, for example.

Title
Method of repairing integrated circuits
Application Number
9/598926
Publication Number
6697979 (B1)
Application Date
June 21, 2000
Publication Date
February 24, 2004
Inventor
Robert Münch
Karlsruhe
US
Martin Vorbach
Karlsruhe
US
Agent
Kenyon & Kenyon
US
Assignee
Pact XPP Technologies
US
IPC
G01R 31/28
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