06385739 is referenced by 66 patents and cites 2 patents.

A self-test electronic assembly performs self-testing, such as diagnostic or run-in testing of components and circuits, based upon internally stored test procedures. The results of self-testing are stored internally to the device, providing valuable information regarding the self-test electronic assembly, both during the manufacturing process, and preferably for ongoing in-situ operation. A test system is preferably linked to one or more self-test electronic assemblies, and provides loopback circuitry for each installed self-test electronic assembly, whereby the self-test electronic assemblies can further test components, circuitry, and security encoding and decoding operation. The preferred test rack also provides efficient and consistent monitoring and quality control over the self-testing of self-test electronic assemblies. During in-situ operation, the self-test electronic assemblies preferably monitor operating parameters, and continue to periodically perform self-testing, while storing the information within the device, and preferably transmitting the information to an external location.

Title
Self-test electronic assembly and test system
Application Number
9/357183
Publication Number
6385739 (B1)
Application Date
July 19, 1999
Publication Date
May 7, 2002
Inventor
David Platt
Mountain View
CA, US
Shahin Tahmassebi
Pleasanton
CA, US
James M Barton
Los Gatos
CA, US
Agent
Kirk Wong
US
Michael A Glenn
US
Assignee
Tivo
CA, US
IPC
G06F 11/00
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