06226766 is referenced by 27 patents and cites 12 patents.

A self-testing smart memory (

28

) is provided in which memory test circuitry (

46

) within the smart memory (

28

) writes a pattern to a data RAM (

32

) and a broadcast RAM (

34

) and then reads the data RAM (

32

) and the broadcast RAM (

34

) to determine if any failures exist within the memory locations. Furthermore, a data path tester (

50

) determines the functionality of a data path (

30

) within smart memory (

28

).

Title
Method and apparatus for built-in self-test of smart memories
Application Number
8/224407
Publication Number
6226766 (B1)
Application Date
April 7, 1994
Publication Date
May 1, 2001
Inventor
Mark G Harward
Dallas
TX, US
Agent
Frederick J Telecky Jr
US
Robert L Troike
US
Assignee
Texas Instruments Incorporated
TX, US
IPC
G11C 29/00
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