06169410 is referenced by 84 patents and cites 6 patents.

A wafer probe with built in components to perform frequency multiplication, upconversion, downconversion, and mixing typically performed by an RF module of a vector network analyzer (VNA). The wafer probe is designed for testing integrated circuits used in collision avoidance radar systems and operates over the 76-77 GHz frequency range allocated by the Federal Communications Commission (FCC) for collision avoidance radars. To minimize costs, the wafer probe preferably utilizes integrated circuits for frequency multiplication, upconversion, downconversion, and mixing manufactured for collision avoidance radar systems.

Title
Wafer probe with built in RF frequency conversion module
Application Number
9/189091
Publication Number
6169410 (A)
Application Date
November 9, 1998
Publication Date
January 2, 2001
Inventor
William W Oldfield
Redwood City
CA, US
Martin I Grace
San Jose
CA, US
Agent
Fliesler Dubb Meyer & Lovejoy
US
Assignee
Anritsu Company
CA, US
IPC
G01R 31/02
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