06154861 is referenced by 6 patents and cites 12 patents.

A self-testing smart memory (28) is provided in which memory test circuitry (46) within the smart memory (28) writes a pattern to a data RAM (32) and a broadcast RAM (34) and then reads the data RAM (32) and the broadcast RAM (34) to determine if any failures exist within the memory locations. Furthermore, a data path tester (50) determines the functionality of a data path (30) within smart memory (28).

Title
Method and apparatus for built-in self-test of smart memories
Application Number
946502
Publication Number
6154861
Application Date
June 7, 1995
Publication Date
November 28, 2000
Inventor
Mark G Harward
Dallas
TX, US
Agent
Frederick J Telecky Jr
Tammy L Williams
Robert L Troike
Assignee
Texas Instruments Incorporated
TX, US
IPC
G06F 11/10
G01R 31/28
G11C 29/00
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