06121611 is referenced by 235 patents and cites 11 patents.

Force sensing probes for use in scanning probe microscopes and a method for coating such probes with a film comprising a magnetostrictive material are provided. The probes may be magnetized by placing them in a magnetic field which can be oriented in any direction with respect to the probes. The magnetostrictive effect leads to a compression or expansion of the magnetic film, altering its length by the strength of the applied field. This in turn causes the probe, which in a preferred embodiment is in the form of a cantilever, and the applied magnetic film, to deflect or bend. The consequent motion of the probe is much greater than that obtained by direct application of a magnetic force and the effect is not sensitive to the direction of the applied field.

Title
Force sensing probe for scanning probe microscopy
Application Number
9/82095
Publication Number
6121611
Application Date
May 20, 1998
Publication Date
September 19, 2000
Inventor
Tianwei Jing
Tempe
AZ, US
Stuart M Lindsay
Phoenix
AZ, US
Agent
Killworth Gottman Hagan & Schaeff
Assignee
Arizona Board of Regents
AZ, US
Molecular Imaging Corporation
AZ, US
IPC
G01B 5/28
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