05657332 is referenced by 492 patents and cites 14 patents.

Soft errors occur during normal use of a solid-state memory such as EEPROM or Flash EEPROM. A soft error results from the programmed threshold voltage of a memory cell being drifted from its originally intended level. The error is initially not readily detected during normal read until the cumulative drift becomes so severe that it develops into a hard error. Data could be lost if enough of these hard errors swamps available error correction codes in the memory. A memory device and techniques therefor are capable of detecting these drifts and substantially maintaining the threshold voltage of each memory cell to its intended level throughout the use of the memory device, thereby resisting the development of soft errors into hard errors.

Title
Soft errors handling in EEPROM devices
Application Number
886030
Publication Number
5657332
Application Date
March 20, 1995
Publication Date
August 12, 1997
Inventor
Sanjay Mehrotra
Milpitas
CA, US
Daniel C Guterman
Fremont
CA, US
Robert D Norman
San Jose
CA, US
John S Mangan
Santa Cruz
CA, US
Jeffrey Craig
Fremont
CA, US
Daniel L Auclair
Mountain View
CA, US
Agent
Majestic Parsons Siebert & Hsue
Assignee
SanDisk Corporation
CA, US
IPC
G11C 11/34
G11C 29/00
View Original Source