05408190 is referenced by 171 patents and cites 30 patents.

A reusable burn-in/test fixture for discrete die consists of two halves. The first half of the test fixture contains cavity in which die is inserted. Electrical contact with bondpads or bumps on the die is established through an intermediate substrate. When the two halves are assembled, electrical contact with the die is established. The fixture establishes the electrical contact and with a burn-in oven and with a discrete die tester. The test fixture need not be opened until the burn-in and electrical tests are completed. The fixture permits the die to be characterized prior to assembly, so that the die may then be transferred in an unpackaged form. The intermediate substrate may be formed of semiconductor material or of a ceramic insulator. A Z-axis anisotropic conductive interconnect material may be interposed between the intermediate substrate and the die.

Title
Testing apparatus having substrate interconnect for discrete die burn-in for nonpackaged die
Application Number
981956
Publication Number
5408190
Application Date
June 7, 1993
Publication Date
April 18, 1995
Inventor
David R Hembree
Boise
ID, US
Warren M Farnworth
Nampa
ID, US
Alan G Wood
Boise
ID, US
Agent
Stephen A Gratton
Stanley N Protigal
Assignee
Micron Technology
ID, US
IPC
G01R 31/02
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