A low cost application specific integrated circuit tester is provided. The tester contains a microprocessor and a test vector RAM bank that is equal in BIT width as the input output pin count of a device under test. The RAM bank holds all vector information for the pins of the device under test. The tester board contains a number of tester ASICs placed between the test vector RAM bank and the devices under test. The tester ASICs are configurable to control the direction of data lines and to compare the results from the device under test to the preloaded RAM data. The present ASIC tester also provides a comparison of the results from two devices under test.