05243274 is referenced by 25 patents and cites 13 patents.

A low cost application specific integrated circuit tester is provided. The tester contains a microprocessor and a test vector RAM bank that is equal in BIT width as the input output pin count of a device under test. The RAM bank holds all vector information for the pins of the device under test. The tester board contains a number of tester ASICs placed between the test vector RAM bank and the devices under test. The tester ASICs are configurable to control the direction of data lines and to compare the results from the device under test to the preloaded RAM data. The present ASIC tester also provides a comparison of the results from two devices under test.

Title
Asic tester
Application Number
7/925684
Publication Number
5243274
Application Date
August 7, 1992
Publication Date
September 7, 1993
Inventor
Larry D Aschliman
Jacobus
PA, US
Randy J Kelsey
Hampstead
MD, US
Agent
Norman A Nixon
Assignee
Westinghouse Electric
PA, US
IPC
G01R 31/28
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