05107208 is referenced by 43 patents and cites 5 patents.

A system for providing testing capability of individual submodules on an integrated circuit module. A test bus having a plurality of conductors is connected to selected internal ports of said submodules through three-way analog switches. Each three-way analog switch provides the capability to observe and control an internal port through combination of the ON/OFF status of two transmission gates. Test patterns for controlling the transmission gates may be provided by onboard D flip-flops which are externally programmed to control or observe ports of an individual submodule.

Title
System for partitioning and testing submodule circuits of an integrated circuit
Application Number
452870
Publication Number
5107208
Application Date
June 11, 1991
Publication Date
April 21, 1992
Inventor
Nai C Lee
Peekskill
NY, US
Agent
Anne E Barschall
Assignee
North American Philips Corporation
NY, US
IPC
G01R 31/28
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