An electronic equipment enclosure includes a card cage for holding a plurality of electronic instrumentation circuit cards. Interface adapters are mounted on the front panels of each of the circuit cards to provide external connections to respective ones of the circuit cards through a connector module at the front end of each interface adapter. A pair of positioning pins are mounted on the front of each interface adapter on opposite sides of the respective connector module. A receiver is hinged to the front of the enclosure and includes upper and lower frames having a series of holes therethrough in correspondence with respective ones of the alignment pins. When the receiver is placed in an upright closed position, the alignment pins engage respective ones of the holes to accurately position the front of each adapter module and corresponding connector module which extend into a module access space between the frames. An interchangeable test adapter (ITA) includes a plurality of connectors corresponding to, and engageable with, the connector modules of the interconnect adapters. The receiver includes a mechanism for positioning the ITA on the front of the receiver over the module access space so that the connectors of the ITA engage corresponding ones of the connector modules. The ITA provides connections for interfacing the instrumentation cards to external equipment, e.g., a unit under test (UUT).