05070297 is referenced by 239 patents and cites 7 patents.

A full wafer integrated circuit testing device (10) tests integrated circuits (15) formed as a wafer in conjunction with a test control unit (40). Probe units (14) associate with respective integrated circuits (15). Probe tips (16) on probe units (14) communicate with respective pads (19) with the integrated circuits (15). Interface circuitry (36) selectively communicates test data between the test control unit (40) and the integrated circuit (15). Test pins (16) have positions on probe units (14) associated with respective integrated circuit connection points (19) for testing associated integrated circuit (15) components. Interface circuitry (36) includes comparators (54 and 56) that compare signals between the integrated circuit (15) and the test control unit (40). Memory components (66 and 68) store data associated with signals from test control unit (40) and said integrated circuit (15). Compliant material (32) assures that probe tips (16) throughout probe card (10) positively and conductively engage integrated circuit pads (19) of all associated integrated circuits (15) of a wafer.

Title
Full wafer integrated circuit testing device
Application Number
7/532481
Publication Number
5070297
Application Date
June 4, 1990
Publication Date
December 3, 1991
Inventor
Eng C Born
Richardson
TX, US
Satwinder Malhi
Garland
TX, US
Masashi Hashimoto
Garland
TX, US
Oh Kyong Kwon
Plano
TX, US
Agent
Richard L Donaldson
Douglas A Sorensen
James C Kesterson
Assignee
Texas Instruments Incorporated
TX, US
IPC
G01R 31/02
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