Disclosed is a test probe  for testing a test device [not shown], also known as a device under test, while precisely controlling the force exerted by the test probe  on the test device. Included is a translation ring  as well as a carrier  formed to have at least a first side and a second side. The support means  is coupled to the translation ring . Also included is at least one flexure pivot  for delivering a force to a test device; the flexure pivot  is coupled to the first side of the carrier. A membrane  is coupled to the second side of the carrier. Finally, at least one signal contact bump  is mounted on the membrane  for communicating an electric current between the test probe  and the test device [not shown].