04928278 is referenced by 59 patents and cites 3 patents.

Calibration of timing errors of each pin electronics unit is carried out by a main controller and a plurality of controllers, each assigned to each pin electronics unit or to each block including a plurality of pin electronics units. A reference timing signal is simultaneously distributed to each pin electronics unit or block, so that the timing error calibration is executed in parallel among the pin electronics units or the blocks.

Title
IC test system
Application Number
7/229780
Publication Number
4928278
Application Date
August 5, 1988
Publication Date
May 22, 1990
Inventor
Naoaki Narumi
Isehara
JP
Taiichi Otsuji
Ebina
JP
Agent
Spencer & Frank
Assignee
Nippon Telegraph and Telephone Corporation
JP
IPC
G01R 31/28
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