04899107 is referenced by 196 patents and cites 6 patents.

A reusable burn-in/test fixture for discrete TAB die consists of two halves. The first half of the test fixture is a die cavity plate for receiving semiconductor dice, and contains cavities in which die are inserted. The second half establishes electrical contact with the dice and with a burn-in oven. The test fixture need not be opened until the burn-in and electrical test are completed. After burn-in stress and electrical test, the die are removed from the test fixture and depositioned accordingly. The technique will allow all elements of the burn-in/test fixture to 100% reusable.

Title
Discrete die burn-in for nonpackaged die
Application Number
7/252606
Publication Number
4899107
Application Date
September 30, 1988
Publication Date
February 6, 1990
Inventor
Alan G Wood
Boise
ID, US
Tim J Corbett
Boise
ID, US
Agent
Jon P Busack
Angus C Fox III
Stanley N Protigal
Assignee
Micron Technology
ID, US
IPC
G01R 31/02
G01R 31/28
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