04853627 is referenced by 105 patents and cites 4 patents.

A wafer probe comprises a support member having an end region which is shaped to permit the end region to be brought into close proximity with a component under test. An amplifier is mounted on the support member at its end region. A conductive probe element is attached to the amplifier and is electrically connected to the amplifier's input terminal. A transmission line is connected to the amplifier's output terminal for transmitting signals from the amplifier to a measurement instrument.

Title
Wafer probes
Application Number
812480
Publication Number
4853627
Application Date
July 11, 1988
Publication Date
August 1, 1989
Inventor
Angus J McCamant
Aloha
OR, US
Robert T Flegal
Beaverton
OR, US
Eric W Strid
Portland
OR, US
Kimberly R Gleason
Portland
OR, US
Agent
William S Lovell
John Smith Hill
Assignee
TriQuint Semiconductor
OR, US
IPC
G01R 31/02
G01R 1/06
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