04779272 is referenced by 76 patents and cites 5 patents.

A variable-threshold non-volatile memory in which a potential falling between a selection and a non-selection level is applied to the gates and the resultant drain current is measured to determine if one of the transistors has an abnormal threshold voltage.

Title
Testable variable-threshold non-volatile semiconductor memory
Application Number
6/923238
Publication Number
4779272
Application Date
October 27, 1986
Publication Date
October 18, 1988
Inventor
Nobuaki Ando
Hyogo
JP
Tsuyoshi Toyama
Hyogo
JP
Kenji Kohda
Hyogo
JP
Agent
Sughrue Mion Zinn Macpeak & Seas
Assignee
Mitsubishi Denki Kabushiki Kaisha
JP
IPC
G01R 31/28
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